NKEK12008U Structural Tools in Nanoscience

The purpose of the course is to give an introduction to modern structural characterization tools in nanoscience and how these are applied in current research. During the course, we will discuss some of the most important experimental tools applied for advanced structural characterization. These tools include:

• Scattering methods using x-rays and neutrons (small angle scattering, wide angle diffraction, total scattering methods) 
• X-ray spectroscopy methods (XANES, EXAFS)
• Scanning and transmission electron microscopy (SEM, TEM) 
• Scanning probe methods, including scanning tunneling microscope and atomic force microscopy (STM, AFM) 
• Chemical characterization tools such as X-ray photoelectron spectroscopy or energy dispersive X-ray spectroscopy (XPS, EDXS)

Scientists with expertise in the individual methods from the Department of Chemistry and other institutions will present the physical basis of the techniques, as well as their strength and weaknesses. Examples from current scientific literature will be included through student presentations of selected research papers.

Apart from lectures and exercises, the students will apply selected experimental techniques for structural characterization. This practical part is very much student driven: The students must organize the lab work within the team, keep a logbook, arrange laboratory time and seek information about the interpretation of the results, etc. A report and a presentation will be produced about the characterization of the samples and findings of the project.

If possible, a one-day visit to a company or large scientific facility will furthermore be arranged.